{"id":5,"date":"2016-11-09T12:16:55","date_gmt":"2016-11-09T12:16:55","guid":{"rendered":"http:\/\/flythemesdemo.net\/campus\/?p=5"},"modified":"2023-10-26T13:04:29","modified_gmt":"2023-10-26T12:04:29","slug":"art-student-showcase-their-work-in-exhibition","status":"publish","type":"post","link":"https:\/\/www.ujfi.fei.stuba.sk\/en\/art-student-showcase-their-work-in-exhibition\/","title":{"rendered":"Sk\u00famanie mikro\u0161trukt\u00fary materi\u00e1lov pomocou rtg difrakcie"},"content":{"rendered":"<p>R\u00f6ntgenov\u00e1 difrakcia je met\u00f3da, ktor\u00e1 hr\u00e1 k\u013e\u00fa\u010dov\u00fa \u00falohu pri \u0161t\u00fadiu \u0161trukt\u00fary materi\u00e1lov na mikroskopickej \u00farovni. Technika je zalo\u017een\u00e1 na princ\u00edpe prenikania r\u00f6ntgenov\u00e9ho \u017eiarenia hmotou, ktor\u00e9 prejde cez materi\u00e1l a je rozpt\u00fdlen\u00e9 na at\u00f3mov\u00fdch rovin\u00e1ch sk\u00faman\u00e9ho materi\u00e1lu. Difraktovan\u00fd r\u00f6ntgenov\u00fd l\u00fa\u010d obsahuje inform\u00e1cie o vzdialenostiach medzi at\u00f3mami v kry\u0161t\u00e1li, ako aj o ich usporiadan\u00ed. Laborat\u00f3rium RTG difrakcie je vybaven\u00e9 RTG difraktometrom D8 Advance s vysok\u00fdm rozl\u00ed\u0161en\u00edm, ktor\u00fd m\u00f4\u017ee by\u0165 konfigurovan\u00fd pre v\u0161etky RTG pr\u00e1\u0161kov\u00e9 aplik\u00e1cie, vr\u00e1tane f\u00e1zovej identifik\u00e1cie, kvantitat\u00edvnej f\u00e1zovej anal\u00fdzy a anal\u00fdzy kry\u0161t\u00e1lovej \u0161trukt\u00fary, zvy\u0161kov\u00e9ho pnutia a vy\u0161etrovania text\u00far, RTG reflektometrie a mikrodifrakcie. Zariadenie umo\u017e\u0148uje merania Bragg-Brentanovou geometriou ako aj geometriou paraleln\u00e9ho l\u00fa\u010da, pri\u010dom prep\u00ednanie medzi t\u00fdmito geometriami je plne motorizovan\u00e9 (softv\u00e9rovo ovl\u00e1dan\u00e9). Difraktometer umo\u017e\u0148uje merania pri dvoch vlnov\u00fdch d\u013a\u017ekach v z\u00e1vislosti od typu RTG lampy. K dispoz\u00edcii je Cu a Co lampa.<\/p>\n<p>Medzi hlavn\u00e9 oblasti v\u00fdskumu patr\u00ed:<\/p>\n<ul>\n<li>sk\u00famanie kry\u0161talickej \u0161trukt\u00fary polovodi\u010dov, ktor\u00e9 m\u00f4\u017ee a pom\u00f4c\u0165 pri v\u00fdvoji nov\u00fdch materi\u00e1lov s lep\u0161\u00edmi elektrick\u00fdmi vlastnos\u0165ami.<\/li>\n<li>kontrola kvality materi\u00e1lov, ako napr. kovy, polym\u00e9ry a keramika pou\u017e\u00edvan\u00fdch pri v\u00fdrobe elektronick\u00fdch zariaden\u00ed.<\/li>\n<li>v\u00fdskum materi\u00e1lov pre elektrochemick\u00e9 zariadenia, ako s\u00fa bat\u00e9rie, sol\u00e1rne a palivov\u00e9 \u010dl\u00e1nky.<\/li>\n<\/ul>\n\n\n<p>Viac v \u010dl\u00e1nku:<\/p>\n\n\n\n<p><a href=\"https:\/\/www.sciencedirect.com\/science\/article\/pii\/S0169433216312879?pes=vor\" data-type=\"link\" data-id=\"https:\/\/www.sciencedirect.com\/science\/article\/pii\/S0169433216312879?pes=vor\">DOBRO\u010cKA, Edmund &#8211; NOV\u00c1K, Patrik &#8211; B\u00daC, Dalibor &#8211; HARMATHA, Ladislav &#8211; MUR\u00cdN, Just\u00edn. X-ray diffraction analysis of residual stresses in textured ZnO thin films. In <em>Applied Surface Science<\/em>. Vol. 395, (2017), s. 16-23. ISSN 0169-4332 (2017: 4.439 &#8211; IF, Q1 &#8211; JCR Best Q, 1.093 &#8211; SJR, Q1 &#8211; SJR Best Q). V datab\u00e1ze: CC: 000390428300004.<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"<p>R\u00f6ntgenov\u00e1 difrakcia je met\u00f3da, ktor\u00e1 hr\u00e1 k\u013e\u00fa\u010dov\u00fa \u00falohu pri \u0161t\u00fadiu \u0161trukt\u00fary materi\u00e1lov na mikroskopickej \u00farovni. Technika je zalo\u017een\u00e1 na princ\u00edpe prenikania r\u00f6ntgenov\u00e9ho \u017eiarenia hmotou, ktor\u00e9 prejde cez materi\u00e1l a je rozpt\u00fdlen\u00e9 na at\u00f3mov\u00fdch rovin\u00e1ch sk\u00faman\u00e9ho materi\u00e1lu. Difraktovan\u00fd r\u00f6ntgenov\u00fd l\u00fa\u010d obsahuje inform\u00e1cie o vzdialenostiach medzi at\u00f3mami v kry\u0161t\u00e1li, ako aj o ich usporiadan\u00ed. Laborat\u00f3rium RTG difrakcie je vybaven\u00e9 RTG difraktometrom D8 Advance s vysok\u00fdm rozl\u00ed\u0161en\u00edm, ktor\u00fd m\u00f4\u017ee by\u0165 konfigurovan\u00fd pre v\u0161etky RTG pr\u00e1\u0161kov\u00e9 aplik\u00e1cie, vr\u00e1tane f\u00e1zovej identifik\u00e1cie, kvantitat\u00edvnej f\u00e1zovej anal\u00fdzy a anal\u00fdzy kry\u0161t\u00e1lovej \u0161trukt\u00fary, zvy\u0161kov\u00e9ho pnutia a vy\u0161etrovania text\u00far, RTG reflektometrie a mikrodifrakcie. Zariadenie umo\u017e\u0148uje merania Bragg-Brentanovou geometriou ako aj geometriou&#8230; <\/p>\n","protected":false},"author":1,"featured_media":762,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[9],"tags":[],"class_list":["post-5","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-fyzika-materialov"],"_links":{"self":[{"href":"https:\/\/www.ujfi.fei.stuba.sk\/en\/wp-json\/wp\/v2\/posts\/5","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.ujfi.fei.stuba.sk\/en\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.ujfi.fei.stuba.sk\/en\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.ujfi.fei.stuba.sk\/en\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.ujfi.fei.stuba.sk\/en\/wp-json\/wp\/v2\/comments?post=5"}],"version-history":[{"count":0,"href":"https:\/\/www.ujfi.fei.stuba.sk\/en\/wp-json\/wp\/v2\/posts\/5\/revisions"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.ujfi.fei.stuba.sk\/en\/wp-json\/wp\/v2\/media\/762"}],"wp:attachment":[{"href":"https:\/\/www.ujfi.fei.stuba.sk\/en\/wp-json\/wp\/v2\/media?parent=5"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.ujfi.fei.stuba.sk\/en\/wp-json\/wp\/v2\/categories?post=5"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.ujfi.fei.stuba.sk\/en\/wp-json\/wp\/v2\/tags?post=5"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}