{"id":1020,"date":"2024-02-14T12:29:00","date_gmt":"2024-02-14T11:29:00","guid":{"rendered":"https:\/\/www.ujfi.fei.stuba.sk\/?p=1020"},"modified":"2024-02-14T12:32:36","modified_gmt":"2024-02-14T11:32:36","slug":"laboratorium-mikroskopie-afm-mfm","status":"publish","type":"post","link":"https:\/\/www.ujfi.fei.stuba.sk\/en\/laboratorium-mikroskopie-afm-mfm\/","title":{"rendered":"Laborat\u00f3rium mikroskopie AFM\/MFM"},"content":{"rendered":"\n

Mikroskopia atom\u00e1rnych s\u00edl (AFM = Atomic Force Microscopy<\/em>) sk\u00fama vlastnosti povrchov vzoriek pomocou silovej interakcie p\u00f4sobiacej medzi mikroskopickou sondou a povrchom vzorky. Sondu tvor\u00ed ostr\u00fd hrot na vo\u013enom konci pru\u017en\u00e9ho nosn\u00edka. Polomer \u0161pi\u010dky hrotu je be\u017ene men\u0161\u00ed ako jedna stotis\u00edcina milimetra a hr\u00fabka nosn\u00edka je na \u00farovni jednotiek tis\u00edcin milimetra. Nano-sonda je priveden\u00e1 do bezprostrednej bl\u00edzkosti povrchu vzorky, n\u00e1sledne mikroskop povrch skenuje po riadkoch a sleduje mechanick\u00e9 odozvy nosn\u00edka vyvolan\u00e9 p\u00f4soben\u00edm atom\u00e1rnych s\u00edl na hrot. Tieto odozvy s\u00fa zaznamenan\u00e9 optick\u00fdm syst\u00e9mom. V\u00fdsledkom merania je 3D-rekon\u0161trukcia topografie povrchu vo forme 2D alebo 3D obr\u00e1zku. Okrem obrazu v\u00fd\u0161ky mikroskop dok\u00e1\u017ee mera\u0165 a zobrazova\u0165 obraz, ktor\u00fd poskytuje dodato\u010dn\u00e9 inform\u00e1cie o vlastnostiach sk\u00faman\u00e9ho materi\u00e1lu a umo\u017e\u0148uje lep\u0161ie porozumenie jeho \u0161trukt\u00fare (re\u017eim sn\u00edmania obrazu naz\u00fdvan\u00fd ako “phase imaging<\/em>“). Z tohto obrazu je napr. mo\u017en\u00e9 rozl\u00ed\u0161i\u0165 lok\u00e1lne zmeny v tuhosti materi\u00e1lu na povrchu alebo in\u00e9 jeho vlastnosti.<\/p>\n\n\n\n

Mikroskopia magnetick\u00fdch s\u00edl (MFM = Magnetic Force Microscopy<\/em>) je \u0161peci\u00e1lny re\u017eim mikroskopu at\u00f3m\u00e1rnych s\u00edl, ktor\u00fd zaznamen\u00e1va gradient magnetick\u00e9ho po\u013ea nad povrchom magnetickej vzorky. Tento re\u017eim poskytuje jedine\u010dn\u00fa mo\u017enos\u0165 vizualizova\u0165 a \u0161tudova\u0165 magnetick\u00e9 dom\u00e9ny na povrchu materi\u00e1lu. Dom\u00e9nov\u00e1 \u0161trukt\u00fara magnetick\u00fdch materi\u00e1lov je \u00fazko sp\u00e4t\u00e1 s procesom ich premagnetovania. \u0160t\u00fadium magnetick\u00fdch nano\u0161trukt\u00far pomocou MFM je k\u013e\u00fa\u010dov\u00e9 vo v\u00fdvoji nov\u00fdch materi\u00e1lov s vylep\u0161en\u00fdmi magnetick\u00fdmi vlastnos\u0165ami, napr\u00edklad v oblasti magnetick\u00fdch z\u00e1znamov\u00fdch m\u00e9di\u00ed, ale aj v energetickom sektore. Pr\u00edkladom energetick\u00e9ho vyu\u017eitia s\u00fa nanokry\u0161talick\u00e9 kovov\u00e9 zliatiny, ktor\u00e9 sa uk\u00e1zali ako efekt\u00edvne v transform\u00e1toroch na minimaliz\u00e1ciu energetick\u00fdch str\u00e1t.<\/p>\n\n\n\n

\"\"
Obr.: a) 3D AFM obr\u00e1zok monovrstvy SiO2 gu\u013e\u00f4\u010dok tvoriacich fotonick\u00fd kry\u0161t\u00e1l; MFM obr\u00e1zok dom\u00e9novej \u0161trukt\u00fary b) nanokry\u0161talickej magneticky m\u00e4kkej zliatiny 57<\/sup>Fe90<\/sub>Zr7<\/sub>B3<\/sub> a c) 60 nm hrubej plan\u00e1rnej vrstvy Ni. Obr\u00e1zky s\u00fa v\u00fdsledkom spolupr\u00e1ce s prof. Ing. Martinom Weisom, DrSc. z \u00daEF FEI STU (a, c) a s prof. Ing. Marcelom Miglierinim, DrSc z n\u00e1\u0161ho \u00fastavu (b).<\/figcaption><\/figure>\n\n\n\n

V\u00fdhody met\u00f3dy AFM:<\/strong><\/p>\n\n\n\n

    \n
  • vysok\u00e9 priestorov\u00e9 rozl\u00ed\u0161enie (zvy\u010dajne desatiny nanometra v smere kolmom na povrch vzorky. V \u0161pecifick\u00fdch podmienkach mo\u017eno dosiahnu\u0165 skuto\u010dn\u00e9 atom\u00e1rne rozl\u00ed\u0161enie vo v\u0161etk\u00fdch troch smeroch XYZ.)<\/li>\n\n\n\n
  • schopnos\u0165 zaznamen\u00e1va\u0165 v\u00fd\u0161ku (\u010do umo\u017e\u0148uje vyhodnocova\u0165 parametre ako priemern\u00e1 v\u00fd\u0161ka v\u00fdstupkov (zrna), distrib\u00facia ve\u013ekosti z\u0155n, plocha a objem povrchu na nanometrovej \u00farovni).<\/li>\n\n\n\n
  • univerz\u00e1lnos\u0165 – met\u00f3da dok\u00e1\u017ee analyzova\u0165 tuh\u00e9 i m\u00e4kk\u00e9, vodiv\u00e9 i nevodiv\u00e9 povrchy, anorganick\u00e9 i organick\u00e9 materi\u00e1ly.<\/li>\n\n\n\n
  • schopnos\u0165 skenova\u0165 povrchy v kvapalnom prostred\u00ed (net\u00fdka sa n\u00e1\u0161ho zariadenia)<\/li>\n\n\n\n
  • nede\u0161trukt\u00edvna a neinvaz\u00edvna met\u00f3da<\/li>\n<\/ul>\n\n\n\n

    V\u00fdhody techniky MFM:<\/strong><\/p>\n\n\n\n

      \n
    • vizualiz\u00e1cia povrchovej magnetickej dom\u00e9novej \u0161trukt\u00fary vzorky<\/li>\n\n\n\n
    • vysok\u00e9 priestorov\u00e9 rozl\u00ed\u0161enie (cca 50 nm v later\u00e1lnom smere)<\/li>\n\n\n\n
    • mo\u017en\u00e9 analyzova\u0165 vz\u0165ah medzi magnetizmom a topografiou, preto\u017ee oba z\u00e1znamy sa z\u00edskavaj\u00fa z rovnak\u00e9ho miesta na povrchu vzorky<\/li>\n<\/ul>\n\n\n\n

      \u0160pecifick\u00e9 po\u017eiadavky na vzorky vypl\u00fdvaj\u00face z konfigur\u00e1cie n\u00e1\u0161ho mikroskopu:<\/strong><\/p>\n\n\n\n

        \n
      • pevn\u00e9, such\u00e9 l\u00e1tky s ploch\u00fdm a \u010dist\u00fdm povrchom s malou drsnos\u0165ou (ide\u00e1lne v jednotk\u00e1ch nanometrov, max. v jednotk\u00e1ch mikrometrov)<\/li>\n\n\n\n
      • mo\u017en\u00e9 realizova\u0165 merania aj na rozmerovo ve\u013ek\u00fdch vzork\u00e1ch (v\u00fd\u0161ka do 2 cm, plocha do 30 cm x 30 cm. Ak je plocha vzorky do 15 cm x 15 cm, tak na jej povrchu mo\u017eno skenova\u0165 \u013eubovo\u013en\u00e9 miesto. Od tejto plochy vy\u0161\u0161ie plat\u00ed, \u017ee \u010d\u00edm v\u00e4\u010d\u0161ia plocha vzorky, t\u00fdm viac sa koncentruje oblas\u0165, ktor\u00fa mo\u017eno skenova\u0165 do stredu vzorky.)<\/li>\n\n\n\n
      • vzorku mo\u017eno orientova\u0165 aj vertik\u00e1lne, ale nie je to be\u017en\u00e9<\/li>\n<\/ul>\n\n\n\n

        M\u00e1me praktick\u00e9 sk\u00fasenosti s anal\u00fdzou t\u00fdchto materi\u00e1lov:<\/strong><\/p>\n\n\n\n

        Amorfn\u00e9 kovov\u00e9 zliatiny, nanokry\u0161talick\u00e9 zliatiny, z\u00e1znamov\u00e9 m\u00e9dia, nanomagnety, fotonick\u00e9 kry\u0161t\u00e1ly, supravodi\u010de, tenk\u00e9 vrstvy, organick\u00e9 tranzistory, organick\u00e9 polovodi\u010de, vrstvy OLED displejov, vodiv\u00e9 polym\u00e9ry, feroelektrick\u00e9 kopolym\u00e9ry, polym\u00e9rov\u00e9 f\u00f3lie, organick\u00e9 zl\u00fa\u010deniny, \u013eudsk\u00e1 slezina, GaAs substr\u00e1ty, litogra\ufb01ck\u00e9 masky, ocele, bin\u00e1rne zliatiny, bin\u00e1rne zl\u00fa\u010deniny, nano\u010dastice obalen\u00e9 organickou vrstvou.
        Povrchy v stave: z\u00e1kladnom, po \u017e\u00edhan\u00ed, br\u00fasen\u00ed, le\u0161ten\u00ed, leptan\u00ed, \u010disten\u00ed, l\u00e1man\u00ed alebo implant\u00e1cii.<\/p>\n\n\n\n

        Najcitovanej\u0161\u00ed \u010dl\u00e1nok s AFM meraniami vykon\u00e1van\u00fdmi v na\u0161om laborat\u00f3riu:<\/strong><\/p>\n\n\n\n

        J. Nevrela, M. Micjan, M. Novota, S. Kovacova, M. Pavuk, P. Juhasz, J. Kovac Jr., J. Jakabovic, M. Weis, Secondary doping in poly(3,4-ethylenedioxythiophene):Poly(4-styrenesulfonate) thin films, J. Polym. Sci. B: Polym. Phys. 53(16) (2015) 1139-1146, citovan\u00fd 77 kr\u00e1t (k Feb 2024), DOI: 10.1002\/polb.23754<\/p>\n\n\n\n

        Kontaktn\u00e1 osoba:<\/strong> Ing. Milan Pav\u00fak, PhD.<\/p>\n","protected":false},"excerpt":{"rendered":"

        Mikroskopia atom\u00e1rnych s\u00edl (AFM = Atomic Force Microscopy) sk\u00fama vlastnosti povrchov vzoriek pomocou silovej interakcie p\u00f4sobiacej medzi mikroskopickou sondou a povrchom vzorky. Sondu tvor\u00ed ostr\u00fd hrot na vo\u013enom konci pru\u017en\u00e9ho nosn\u00edka. Polomer \u0161pi\u010dky hrotu je be\u017ene men\u0161\u00ed ako jedna stotis\u00edcina milimetra a hr\u00fabka nosn\u00edka je na \u00farovni jednotiek tis\u00edcin milimetra. Nano-sonda je priveden\u00e1 do bezprostrednej bl\u00edzkosti povrchu vzorky, n\u00e1sledne mikroskop povrch skenuje po riadkoch a sleduje mechanick\u00e9 odozvy nosn\u00edka vyvolan\u00e9 p\u00f4soben\u00edm atom\u00e1rnych s\u00edl na hrot. Tieto odozvy s\u00fa zaznamenan\u00e9 optick\u00fdm syst\u00e9mom. V\u00fdsledkom merania je 3D-rekon\u0161trukcia topografie povrchu vo forme 2D alebo 3D obr\u00e1zku. Okrem obrazu v\u00fd\u0161ky mikroskop dok\u00e1\u017ee mera\u0165 a… <\/p>\n","protected":false},"author":1,"featured_media":1023,"comment_status":"closed","ping_status":"","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[10],"tags":[],"class_list":["post-1020","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-vyskum-a-diagnostika-materialov"],"_links":{"self":[{"href":"https:\/\/www.ujfi.fei.stuba.sk\/en\/wp-json\/wp\/v2\/posts\/1020","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.ujfi.fei.stuba.sk\/en\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.ujfi.fei.stuba.sk\/en\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.ujfi.fei.stuba.sk\/en\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.ujfi.fei.stuba.sk\/en\/wp-json\/wp\/v2\/comments?post=1020"}],"version-history":[{"count":0,"href":"https:\/\/www.ujfi.fei.stuba.sk\/en\/wp-json\/wp\/v2\/posts\/1020\/revisions"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.ujfi.fei.stuba.sk\/en\/wp-json\/wp\/v2\/media\/1023"}],"wp:attachment":[{"href":"https:\/\/www.ujfi.fei.stuba.sk\/en\/wp-json\/wp\/v2\/media?parent=1020"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.ujfi.fei.stuba.sk\/en\/wp-json\/wp\/v2\/categories?post=1020"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.ujfi.fei.stuba.sk\/en\/wp-json\/wp\/v2\/tags?post=1020"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}